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Conclusion The information
content of an EXAFS signal is estimated by the product of the lengths
of intervals it occupies in the wavevector space and its Fourier transform
space. A good spectrum may contain 25 "independent points"
i.e. up to 25 parameters can be meaningfully determined in a variational
refinement of a model of the structure of the sample. This may not seem
much in comparison to the single-crystal XRD method where the intensities
of ~104 diffraction points may be determined in a single measurement.
On the other side, the information content of EXAFS is entirely comparable
to the powder XRD where similar methods of refinement are employed.
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