


Conclusion The information
content of an EXAFS signal is estimated by the product of the lengths
of intervals it occupies in the wavevector space and its Fourier transform
space. A good spectrum may contain 25 "independent points"
i.e. up to 25 parameters can be meaningfully determined in a variational
refinement of a model of the structure of the sample. This may not
seem
much in comparison to the singlecrystal XRD method where the intensities
of ~10^4 diffraction points may be determined in a single measurement.
On the other side, the information content of EXAFS is entirely comparable
to the powder XRD where similar methods of refinement are employed.
